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Communication Dans Un Congrès Année : 2023

Characterisation of Fragmented Ultra-high Energy Heavy Ion Beam and its Effects on Electronics Single Event Effect Testing

Résumé

Ultra-high energy heavy ion beam fragmentation has important implications concerning electronics testing. Primary ion beam and its fragments are characterised by means of electronic detectors, deepening in the consequences for SEE testing in commercial components.
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Dates et versions

hal-04308693 , version 1 (27-11-2023)

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  • HAL Id : hal-04308693 , version 1

Citer

Mario Sacristan Barbero, Ivan Slipukhin, D. Prelipcean, Y. Aguiar, N. Emriskova, et al.. Characterisation of Fragmented Ultra-high Energy Heavy Ion Beam and its Effects on Electronics Single Event Effect Testing. European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2023, Toulouse, France. ⟨hal-04308693⟩
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