Characterisation and simulation of digital device electromagnetic noise under non-ambient temperature conditions
Résumé
We present a new approach of the evaluations of electromagnetic emissions of electronics circuits under thermal stress. Near-field radiations, essentially magnetic type due to the current switching of CMOS chips, have been measured with different external temperature conditions. Electrical equivalent models are proposed to investigate thermal influences on Electromagnetic Compatibility (EMC) characteristics of a Printed Circuit Board(PCB) excited by digital sources.
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