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Communication Dans Un Congrès Année : 2023

Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments

Résumé

Processing units are sensitive to the harsh radiation conditions present in space applications. Thus, radiation testing is a mandatory step toward high reliability for these systems. Notably, as an emerging processor architecture, RISC-V has attained interest for its utilization in these applications. For this reason, in previous work, we presented a faulttolerant RISC-V System-on-Chip (SoC) with enhanced fault awareness, known as HARV-SoC, to attend to this increasing demand. The SoC includes structures to detect, correct, and report radiation-induced errors. In this work, we characterize HARV-SoC under proton irradiation, enabling the proposition of space applications based on a low-cost and open-source RISC-V solution. We observed and reported the effects of Single Event Effects (SEEs) and Total Ionizing Dose (TID) in the entire SoC, individually evaluating the HARV core, SoC elements, and external memories, with a detailed analysis of error propagation.
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Dates et versions

hal-04266887 , version 1 (31-10-2023)

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Douglas Santos, André Mattos, Douglas Melo, Luigi Dilillo. Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments. DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩. ⟨hal-04266887⟩
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