Accurate Measurement of the Linewidth Enhancement Factor of Semiconductor Lasers by a Simple Technique - Archive ouverte HAL
Communication Dans Un Congrès Année : 2023

Accurate Measurement of the Linewidth Enhancement Factor of Semiconductor Lasers by a Simple Technique

Résumé

The high-frequency modulation of semiconductor laser's pump current is used in several important applications, such as high-speed data telecommunications[1], direct-modulation optoelectronic oscillators[2], optical sampling with gain-switched regimes and so forth. linewidth enhancement factor (LEF) the quantity that describes coupling phase fluctuations to intensity has consequences laser broadening pulse chirping. A good knowledge LEF essential predict behavior a modulated laser. measurement tricky many methods have been proposed, based on injection/feedback, small/large signal modulation, or spectral measurements[3]. Here we propose novel method[4] complete field reconstruction technique[5]. This method rather simple implementation requires common opto-electronic lab instruments, i.e. Mach-Zehnder modulator (MZM), RF synthesizers, shifter, an spectrum analyzer (OSA), see Fig. 1a. technique consists modulating source measuring for various delays <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\tau$</tex> , allows retrieving iteratively phase.
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Dates et versions

hal-04264941 , version 1 (30-10-2023)

Identifiants

Citer

Brian Sinquin, Marco Romanelli. Accurate Measurement of the Linewidth Enhancement Factor of Semiconductor Lasers by a Simple Technique. 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), Jun 2023, Munich, Germany. ⟨10.1109/cleo/europe-eqec57999.2023.10231566⟩. ⟨hal-04264941⟩
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