Fabrication and characterization of Sb-Te based thin films containing gallium - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2023

Fabrication and characterization of Sb-Te based thin films containing gallium

Magdalena Kotrla
  • Fonction : Auteur correspondant
Jan Gutwirth
Petr Janíček
Tomas Halenkovic
Marek Bouška
  • Fonction : Auteur correspondant
Petr Nemec

Résumé

Sb-Te thin films modified with gallium were deposited by radio-frequency magnetron co-sputtering. Deposited characterized focusing on their phase change behavior.
Fichier non déposé

Dates et versions

hal-04262143 , version 1 (27-10-2023)

Identifiants

Citer

Magdalena Kotrla, Jan Gutwirth, Petr Janíček, Tomas Halenkovic, Marek Bouška, et al.. Fabrication and characterization of Sb-Te based thin films containing gallium. Integrated Photonics Research, Silicon and Nanophotonics, Jul 2023, Busan, South Korea. ⟨10.1364/iprsn.2023.jtu4a.3⟩. ⟨hal-04262143⟩
10 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More