New developments in measuring silicon isotopes by MC-ICP-MS
Résumé
Introduction
A MC-ICP-MS (Multi Collector Inductively Plasma Mass
Spectrometer from Nu Instruments) has been tested to
precisely detect variations in the isotopic composition of Si on
several samples.
Results and Discussion
Variation in sample 28Si/29Si ratios are expressed as δ29Si
units, which represent deviations in ‰ from the same ratio in
a sample relative to a quartz standard measured using the
bracketing “standard-sample-standard” technique. Taking into
account the interferences of N2, CO and NO in the Si mass
region, and measuring in dynamic mode the Mg isotopes as
internal standard, the repeatability on the δ29Si measurements
is better than 0.15 ‰ and its individual precision better than
0.05 ‰. Its accuracy is estimated by inter-laboratory
comparison. Factors that are found to strongly affect the
precision and accuracy of isotope ratio measurements by MCICP-MS are mass discrimination of interferences, drift of the
isotope ratio and matrix effects. We will present the results
obtained on natural silica and opal (quartz, diatoms, sponges)
and artificial samples. We will discuss the various analytical
methodologies tested (e.g., dry/wet plasma, sample
dissolution, Si/Mg ratios, sensitivity).
Conclusion
These results are of great relevance regarding
environmental and geological sciences where Si isotopes
could open up a range of new analytical studies. Moreover, the
MC-ICP-MS technique has obvious advantages over previous
mass spectrometry techniques used to determine Si isotope
ratios. The sample introduction system does not request
handling dangerous chemicals and the instrument presents
very good precision and sensitivity.