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Brevet Année : 2023

Method and device for measuring the state of health of semiconductor-based electronic components

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hal-04236407 , version 1 (10-10-2023)

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  • HAL Id : hal-04236407 , version 1

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Zoubir Khatir. Method and device for measuring the state of health of semiconductor-based electronic components. France, N° de brevet: WO/2023/094205. 2023. ⟨hal-04236407⟩
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