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Article Dans Une Revue European Physical Journal: Applied Physics Année : 2004

TEM measurement of the misfit stress by a curvature method in semiconducting epitaxial system

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hal-04175602 , version 1 (02-08-2023)

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Anne Ponchet, M. Cabié, A. Rocher. TEM measurement of the misfit stress by a curvature method in semiconducting epitaxial system. European Physical Journal: Applied Physics, 2004, 26 (2), pp.87-94. ⟨10.1051/epjap:2004026⟩. ⟨hal-04175602⟩
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