Assessment of the structural quality of CdTe/Cd1− x Zn x Te strained superlattices by high-resolution x-ray diffraction and photoluminescence studies - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 1990

Assessment of the structural quality of CdTe/Cd1− x Zn x Te strained superlattices by high-resolution x-ray diffraction and photoluminescence studies

Anne Ponchet
G. Lentz
  • Fonction : Auteur
H. Tuffigo
  • Fonction : Auteur
N. Magnea
  • Fonction : Auteur
H. Mariette
  • Fonction : Auteur
P. Gentile
  • Fonction : Auteur

Résumé

We present a detailed analysis of x-ray double-diffraction rocking-curve measurements and low-temperature photoluminescence spectroscopy of (001) CdTe-CdxZn1−xTe strained-layer superlattices grown by molecular-beam epitaxy. The presence of very sharp satellite reflections demonstrate smooth interfaces with a well-defined modulation of both composition and perpendicular stress. Using a kinematical step model, the thickness, strain, and composition of the wells and the barriers are extracted. It is shown that fluctuations of 1 monolayer of the average period can be reproducibly obtained in such superlattices, in excellent agreement with the in situ reflection of high-energy electron diffraction oscillations measurements. The structural perfection of these superlattices is confirmed by the optical spectra which exhibit sharp excitonic transitions.
Fichier non déposé

Dates et versions

hal-04175218 , version 1 (01-08-2023)

Identifiants

Citer

Anne Ponchet, G. Lentz, H. Tuffigo, N. Magnea, H. Mariette, et al.. Assessment of the structural quality of CdTe/Cd1− x Zn x Te strained superlattices by high-resolution x-ray diffraction and photoluminescence studies. Journal of Applied Physics, 1990, 68 (12), pp.6229-6233. ⟨10.1063/1.346887⟩. ⟨hal-04175218⟩
3 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More