A mini scanning device for profiling charged beams
Résumé
In this article we present the development of a mini scanner device to characterize the full transverse spatial density of a charged particle beam using computed tomography. The profiler consists of a wire mounted on a linear translator that can rotate around the beam. Tests were performed on a millimeter electron beam with 200 eV energy and 100 nA intensity, which allowed us to control and monitor both beam focusing and deflection.
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|