PeakForce AFM Analysis Enhanced with Model Reduction Techniques - Archive ouverte HAL
Article Dans Une Revue Sensors Année : 2023

PeakForce AFM Analysis Enhanced with Model Reduction Techniques

Résumé

PeakForce quantitative nanomechanical AFM mode (PF-QNM) is a popular AFM technique designed to measure multiple mechanical features (e.g., adhesion, apparent modulus, etc.) simultaneously at the exact same spatial coordinates with a robust scanning frequency. This paper proposes compressing the initial high-dimensional dataset obtained from the PeakForce AFM mode into a subset of much lower dimensionality by a sequence of proper orthogonal decomposition (POD) reduction and subsequent machine learning on the low-dimensionality data. A substantial reduction in user dependency and subjectivity of the extracted results is obtained. The underlying parameters, or "state variables", governing the mechanical response can be easily extracted from the latter using various machine learning techniques. Two samples are investigated to illustrate the proposed procedure (i) a polystyrene film with low-density polyethylene nano-pods and (ii) a PDMS film with carbon-iron particles. The heterogeneity of material, as well as the sharp variation in topography, make the segmentation challenging. Nonetheless, the underlying parameters describing the mechanical response naturally offer a compact representation allowing for a more straightforward interpretation of the high-dimensional force-indentation data in terms of the nature (and proportion) of phases, interfaces, or topography. Finally, those techniques come with a low processing time cost and do not require a prior mechanical model.
Fichier principal
Vignette du fichier
sensors-23-04730-v2.pdf (6.06 Mo) Télécharger le fichier
Origine Fichiers éditeurs autorisés sur une archive ouverte

Dates et versions

hal-04116696 , version 1 (05-06-2023)

Identifiants

Citer

Xuyang Chang, Simon Hallais, Kostas Danas, Stéphane Roux. PeakForce AFM Analysis Enhanced with Model Reduction Techniques. Sensors, 2023, 23 (10), pp.4730. ⟨10.3390/s23104730⟩. ⟨hal-04116696⟩
31 Consultations
33 Téléchargements

Altmetric

Partager

More