X-ray tomography crystal characterization: Growth monitoring - Archive ouverte HAL Access content directly
Journal Articles Journal of Crystal Growth Year : 2023

X-ray tomography crystal characterization: Growth monitoring

Abstract

In this study, we present a new approach for the growth monitoring of crystals using micro X-ray computed tomography (XCT). This technique allows us to track the evolution of the total crystal volume and surface in real time, and to calculate the growth rate. By segmenting the 3D XCT images using a robust method, we are able to extract detailed information about the crystals, such as their number, volume, diameter, and sphericity. Additionally, we determine the growth rates of individual crystal faces. Our method has the potential to greatly benefit the pharmaceutical and chemical industries, as it provides insight into the structural parameters of crystals during growth, which is crucial for optimization and control.
No file

Dates and versions

hal-04071090 , version 1 (17-04-2023)

Identifiers

Cite

Gautier Hypolite, Jérôme Vicente, Hugo Taligrot, Philippe Moulin. X-ray tomography crystal characterization: Growth monitoring. Journal of Crystal Growth, 2023, 612, pp.127187. ⟨10.1016/j.jcrysgro.2023.127187⟩. ⟨hal-04071090⟩
15 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More