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Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2014

RFID Test Platform: Nonlinear Characterization

Résumé

This paper presents a complete radio frequency identification (RFID) test platform to characterize the nonlinear effects produced by passive ultra-high frequency (UHF) RFID chips. In full operation mode, automated measurements of activation power, harmonic response level, and impedances are performed in a wide frequency range up to the fourth harmonic. The characterization method, platform composition, and operation are explained through real measurements on UHF Class-1 Generation-2 chips. A harmonic treatment is presented thanks to the joint use of an RFID tester and impedance tuners, and the effect of the antenna-chip impedance matching on the harmonic responses is compared before and after treatment. To the best of our knowledge, no similar platform has been presented in the literature.
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Dates et versions

hal-04066224 , version 1 (12-04-2023)

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Gianfranco Andia Vera, Yvan Duroc, Smail Tedjini. RFID Test Platform: Nonlinear Characterization. IEEE Transactions on Instrumentation and Measurement, 2014, 63 (9), pp.2299-2305. ⟨10.1109/TIM.2014.2307754⟩. ⟨hal-04066224⟩

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