[Review] A review of the six-port technique for metrology applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2018

[Review] A review of the six-port technique for metrology applications

Résumé

The six-port measurement technique has played a major role in microwave metrology, particularly within the community of national standards laboratories. The six-port reflectometer provides a simple method of implementing one-port and dual-six-port vector network analyzer. This paper reviews the development of six-port technology for metrology applications.
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Dates et versions

hal-04054247 , version 1 (31-03-2023)

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Simon Lallemand, Kamel Haddadi, Christophe Loyez. [Review] A review of the six-port technique for metrology applications. 2018 22nd International Microwave and Radar Conference (MIKON), May 2018, Poznan, Poland. ⟨10.23919/MIKON.2018.8405340⟩. ⟨hal-04054247⟩
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