Medium-Earth Orbit Spaceflight Radiation Effects in Triple Modular System on Programmable Device
Résumé
This work presents experimental results of medium-Earth orbit (MEO) spaceflight radiation effects in a COTS SRAM-based FPGA (commercial off-the-shelf static random access memory-based field programmable gate array) device implementing a case-study digital system design protected with the classical triple modular redundancy (TMR) technique. This UGA/TIMA’s experiment is a part of the NASA/GSFC’s SET (space environment testbeds) payload launched in the AFRL’s DSX (demonstration and science experiments) spacecraft in June 2019. Results report 69 single-event upset (SEU)-induced failures in the TMR-protected case-study system, moreover total ionizing dose effects for nearly two years of space mission seem not to contribute to an increment of SEU-induced failures.