Neutron Diffraction, Electronic Band Structure, and Electrical Resistivity of Mo3−xRuxSb7
Résumé
Neutron diffraction experiments, KKR-CPA electronic band structure calculations as well as electrical resistivity measurements have been performed on polycrystalline Mo3−xRuxSb7 samples for 0 <= x <= 1. Neutron diffraction studies have been undertaken at room temperature and extended down to 4 K to get a better understanding of the crystalline structure modifications as the Ru content increases. Both structural and chemical characterizations have unambiguously revealed a solubility limit of the Ru atoms close to 0.8. Electronic band structure calculations have provided theoretical evidence of a progressive transition from a metalliclike state (x = 0) towards a semiconducting-like character as x = 1 is approached, although the solubility limit of Ru precludes a crossover to a semiconducting behaviour. The theoretical prediction has been experimentally confirmed by low temperature electrical resistivity measurements from 2 up to 350 K.
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