New Directions in Materials Characterization with Hard X-ray Photoemission
Résumé
X-ray photoemission (XPS) has traditionally been carried out with photon energies up to about 1.5 keV. However, over the last 15 years or so, photoemission with hard x-ray photon energies from ca. 2-12 keV (HAXPES), by now available from both synchrotron and laboratory sources, have opened up exciting new possibilities, especially connected with the greater probing depths that permit studying more bulklike properties in complex materials, as well as buried interfaces in thin films and heterostructures [1].
We will discuss several illustrative applications of HAXPES in oxide materials, heavy fermions compounds and materials in operando conditions, exploring the capabilities of HAXPES specially on the GALAXIES beamline at SOLEIL synchrotron. These energies also permit using x-ray standing-wave (SW) excitation to provide much improved depth resolution [2], which will be illustrated in oxides heterostructures.