Dielectric charging mechanisms involved in the non-typical electron emission yield observed for thin dielectric layers - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2018
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hal-03942905 , version 1 (17-01-2023)

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Charles Rigoudy, Kremena Makasheva, M. Belhaj, S. Dadouch, Gilbert Teyssedre, et al.. Dielectric charging mechanisms involved in the non-typical electron emission yield observed for thin dielectric layers. 15th Spacecraft Charging Technology Conference (SCTC), June 25-29, 2018, Kobe (JAPAN), 2018, Kobe, Japan. ⟨hal-03942905⟩
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