SIC characterization using WCIP
Résumé
This article presents the Wave Concept Iterative Procedure (WCIP), an efficient method for characterization of substrate integrated passive circuits (SIC) based on wave concept formulation and its iterative solution. Improvement of SIW bandpass filter is obtained thanks to this design tool: reduction of the number of vias while keeping same filter response. WCIP simulations are compared to measurements, Finite Element (FEM) and Method of Moment (MOM) simulations. A good agreement is achieved with computation time saving.