OLED Aging Detection through Voltage Noise Characterization under Constant Current - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2022
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hal-03861700 , version 1 (20-11-2022)

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  • HAL Id : hal-03861700 , version 1

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Mustapha El Halaoui, Pascal Dupuis, Laurent Canale, Cédric Renaud, Adel Asselman, et al.. OLED Aging Detection through Voltage Noise Characterization under Constant Current. 2021 Joint Conference - 11th International Conference on Energy Efficiency in Domestic Appliances and Lighting & 17th International Symposium on the Science and Technology of Lighting (EEDAL/LS:17), Université Toulouse 3, Jun 2022, Toulouse, France. pp.1-6. ⟨hal-03861700⟩
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