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Article Dans Une Revue Proceedings of the IEEE Année : 2010

Shunt Behavior in RFID UHF Tag According to ISO Standards and Manufacturer Requirements

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Electronique
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hal-03822609 , version 1 (20-10-2022)

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Alain Moretto, Elizabeth Colin, Christian Ripoll, Sarah Abou Chakra. Shunt Behavior in RFID UHF Tag According to ISO Standards and Manufacturer Requirements. Proceedings of the IEEE, 2010, 98 (9), pp.1550-1554. ⟨10.1109/JPROC.2010.2053510⟩. ⟨hal-03822609⟩
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