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Article Dans Une Revue IEEE Transactions on Industrial Electronics Année : 2012

Reliability Calculation of Multilevel Converters - Theory and Applications

Résumé

Multilevel converters have many power devices and drivers. Thus, a direct reliability calculation based only on the first failure occurrence on one of the components clearly leads them to be devalued compared to two-level converters. However, taking into account that symmetrical multilevel converters such as the X-level ANPCs family are based on imbricated and / or stacked switching cells on the one hand, with an additional center tap at the DC bus in three-phase operation on other hand, several redundancies clearly appear which can be managed to increase the global reliability. For the first time, a general and theoretical methodology used to calculate reliability laws, failure rates and applied to compare 2-level, 3-level and 5-level topologies is proposed. Results show that the fault-handling of 3-level and 5-level three-phase topologies permits a great increase in reliability over a "relatively" short time duration, in addition to other benefits.
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Dates et versions

hal-03796635 , version 1 (04-10-2022)

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Frédéric Richardeau, Thi Thuy Linh Pham. Reliability Calculation of Multilevel Converters - Theory and Applications. IEEE Transactions on Industrial Electronics, 2012, PP (99), ⟨10.1109/TIE.2012.2211315⟩. ⟨hal-03796635⟩
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