A multiline InP-TRL kit for sub-mmWave characterization of InP-HEMT

We investigate the development of on-wafer multiline Thru-Reflect-Line calibration kits to enable transistor characterization beyond 110 GHz. The final objective is to measure the S parameters of a HEMT having a very high cut-off frequency (up to THz range). A first kit design shows that the use of configurations suitable for the frequency bands used in the calibration will optimize the measurements of THz transistors.

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Sciences de l'ingénieur [physics]

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https://hal.science/hal-03794291

Soumis le : lundi 3 octobre 2022-10:45:39

Dernière modification le : mardi 4 juin 2024-13:26:03

Dates et versions

hal-03794291 , version 1 (03-10-2022)

Identifiants

HAL Id : hal-03794291 , version 1
DOI : 10.1109/IRMMW-THz50927.2022.9895722

Citer

R. Younes, Nicolas Wichmann, Sylvie Lepilliet, Guillaume Ducournau, S. Bollaert. A multiline InP-TRL kit for sub-mmWave characterization of InP-HEMT. 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Aug 2022, Delft, Netherlands. pp.1-2, ⟨10.1109/IRMMW-THz50927.2022.9895722⟩. ⟨hal-03794291⟩

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