Dewetting of a substrate, i.e. the liquid film retraction under partial wetting conditions, has been studied extensively over the past decades. This theoretical work deals with the dewetting phenomenon in the presence of liquid evaporation into the pure vapour atmosphere driven by substrate superheating with respect to the saturation temperature corresponding to the vapour pressure. The dynamic profile of the vapour–liquid interface is analysed numerically by using the generalised lubrication approximation that can be applied to an interface slope larger than its conventional counterpart. This approximation uses a phenomenological argument to increase the precision of calculations. For small slopes, it reduces to the conventional lubrication approach. Several nanoscale effects are included in the theory to obtain more precise results: the Kelvin effect, the hydrodynamic slip, the Marangoni effect, the vapour recoil and the interfacial thermal resistance. Their relative importance is discussed. The results include the film shape evolution, the apparent contact angle and the contact line speed, all defined by the substrate superheating and its wetting properties. These dependencies agree with existing experimental results. It is found that the dewetting is accelerated by evaporation. The numerical results are compared to those of the multiscale theory that uses two main parameters, the Voinov angle (the apparent angle obtained within the microregion problem) and the Voinov length. The latter is studied for several fluids as a function of superheating, and an approximate expression for it is proposed. A good agreement between the numerics and the multiscale theory shows the validity of the latter. This means that the dewetting speed in the presence of evaporation can be calculated with an analytical expression that requires only the Voinov angle as a numerical input. Such results are important for many applications, for instance, bubble growth in boiling or film dynamics in heat pipes.