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Article Dans Une Revue Journal of Applied Physics Année : 2006

Determination of interface state distribution in polysilicon thin film transistors from low-frequency noise measurements: Application to analysis of electrical properties

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hal-03776575 , version 1 (13-09-2022)

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L. Pichon, A. Boukhenoufa, C. Cordier, B. Cretu. Determination of interface state distribution in polysilicon thin film transistors from low-frequency noise measurements: Application to analysis of electrical properties. Journal of Applied Physics, 2006, 100 (5), pp.054504. ⟨10.1063/1.2335395⟩. ⟨hal-03776575⟩
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