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Communication Dans Un Congrès Année : 2011

A Framework to Manage Knowledge from Defect Resolution Process

Marc Boyer
Gaël Durand

Résumé

This paper presents a framework for the management, the processing and the reuse, of information relative to defects. This framework is based on the fact that each defect triggers a resolution process in which information about the detected incident (i.e. the problem) and about the applied protocol to resolve it (i.e. the solution) is collected. These different types of information are the cornerstone of the optimization of corrective and preventive processes for new defects. Experimentations show that our prototype provides a very satisfactory quality of results with good performances.
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hal-03763189 , version 1 (30-08-2022)

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Grégory Claude, Marc Boyer, Gaël Durand, Florence Sèdes. A Framework to Manage Knowledge from Defect Resolution Process. 13th IEEE Conference on Commerce and Enterprise Computing (CEC 2011), IEEE, Sep 2011, Luxenbourg, Luxembourg. pp.10-17, ⟨10.1109/CEC.2011.11⟩. ⟨hal-03763189⟩
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