Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of BiCMOS Technologies
Marc Margalef-Rovira
(1, 2)
,
Caroline Maye
(2, 3, 4)
,
Sylvie Lepilliet
(2, 5)
,
Daniel Gloria
(6)
,
Guillaume Ducournau
(2, 4)
,
Christophe Gaquière
(2, 3)
1
TIMA-RMS -
Reliable RF and Mixed-signal Systems
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
3 PUISSANCE - IEMN - Puissance - IEMN
4 PHOTONIQUE THZ - IEMN - Photonique THz - IEMN
5 PCMP - IEMN - Plateforme de Caractérisation Multi-Physiques - IEMN
6 STMicroelectronics
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
3 PUISSANCE - IEMN - Puissance - IEMN
4 PHOTONIQUE THZ - IEMN - Photonique THz - IEMN
5 PCMP - IEMN - Plateforme de Caractérisation Multi-Physiques - IEMN
6 STMicroelectronics
Marc Margalef-Rovira
- Fonction : Auteur
- PersonId : 796577
- ORCID : 0000-0002-6049-7915
Caroline Maye
- Fonction : Auteur
- PersonId : 1121639
Sylvie Lepilliet
- Fonction : Auteur
- PersonId : 745478
- IdHAL : sylvie-lepilliet
Guillaume Ducournau
- Fonction : Auteur
- PersonId : 745611
- IdHAL : guillaume-ducournau
- ORCID : 0000-0002-9171-4767
- IdRef : 090868382
Christophe Gaquière
- Fonction : Auteur
- PersonId : 746853
- IdHAL : christophe-gaquiere
- ORCID : 0000-0003-3082-2489
- IdRef : 059765615
Résumé
This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a transmission line. Thanks to the use of an external short-circuited probe, the effective length of the transmission line can be modified, leading to a phase shift of the reflection coefficient while the attenuator controls its magnitude. Measurement-based results are presented to prove the precision obtained using the external short-circuited probe, while simulation-based results show the performance of the overall system. The system allows complete coverage of the 140-220 GHz band with 2. 5-4.2dB maximum reflection coefficients and minimum reflection coefficients greater than 20 dB, which can be continuously tuned. On the other hand, thanks to the short-circuited probe, virtually, continuous tuning of the phase is also achievable.
Domaines
Sciences de l'ingénieur [physics]Format du dépôt | Notice |
---|---|
Type de dépôt | Communication dans un congrès |
Titre |
en
Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of BiCMOS Technologies
|
Résumé |
en
This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a transmission line. Thanks to the use of an external short-circuited probe, the effective length of the transmission line can be modified, leading to a phase shift of the reflection coefficient while the attenuator controls its magnitude. Measurement-based results are presented to prove the precision obtained using the external short-circuited probe, while simulation-based results show the performance of the overall system. The system allows complete coverage of the 140-220 GHz band with 2. 5-4.2dB maximum reflection coefficients and minimum reflection coefficients greater than 20 dB, which can be continuously tuned. On the other hand, thanks to the short-circuited probe, virtually, continuous tuning of the phase is also achievable.
|
Auteur(s) |
Marc Margalef-Rovira
1, 2
, Caroline Maye
2, 3, 4
, Sylvie Lepilliet
2, 5
, Daniel Gloria
6
, Guillaume Ducournau
2, 4
, Christophe Gaquière
2, 3
1
TIMA-RMS -
Reliable RF and Mixed-signal Systems
( 1043046 )
- Laboratoire TIMA, 46, avenue Félix Viallet - 38031 GRENOBLE Cedex
- France
2
IEMN -
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
( 1066983 )
- [Univ. Lille, CNRS, Centrale Lille Institut, Junia, Univ. Polytechnique Hauts-de-France] ––
Laboratoire Central – Cité Scientifique – Avenue Poincaré – CS 60069 – 59652 VILLENEUVE D’ASCQ CEDEX
- France
3
PUISSANCE - IEMN -
Puissance - IEMN
( 1067481 )
- Groupe Puissance - (Microwave Power Devices group) - IEMN UMR8520
- France
4
PHOTONIQUE THZ - IEMN -
Photonique THz - IEMN
( 1067488 )
- Groupe Photonique THz - IEMN UMR8520 - (Terahertz Photonics)
- France
5
PCMP - IEMN -
Plateforme de Caractérisation Multi-Physiques - IEMN
( 1067502 )
- France
6
STMicroelectronics
( 300430 )
- France
|
Langue du document |
Anglais
|
Vulgarisation |
Non
|
Comité de lecture |
Oui
|
Invité |
Non
|
Audience |
Internationale
|
Date fin congrès |
2022-06-24
|
Ville |
Denver
|
Pays |
États-Unis
|
Actes |
Oui
|
Titre du congrès |
99th ARFTG Microwave Measurement Conference 2022, colocated with IEEE/MTT-S International Microwave Symposium, IMS 2022
|
Date début congrès |
2022-06-24
|
Domaine(s) |
|
Financement |
|
Référence interne |
|
Collaboration/Projet |
|
DOI | 10.1109/ARFTG54656.2022.9896490 |
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