Hot-carrier damage from high to low voltage using the energy-driven framework
Résumé
In this work, we confirm that the energy is the driving force of Hot Carrier effects. When the energy is high, the Energy driven framework allows to retrieve Lucky Electron Model-like equations. But when the energy is lowered, high energy electrons generated by Electron-Electron Scattering become the dominant contribution to the degradation. For even lower energy Multiple Vibrational Excitation mechanism starts taking the lead.