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Article Dans Une Revue Oxidation of Metals Année : 2009

Characterization of sulfur distribution in Ni-based superalloy and thermal barrier coatings after high temperature oxidation: a SIMS analysis

Résumé

Sulfur segregation was characterized by secondary ion mass spectrometry (SIMS) in uncoated single-crystal Ni-based AM1 superalloys with various S contents and on NiPtAl, NiAl and NiPt bondcoats of complete TBC systems. In spite of technical difficulties associated with diffuse sputtered interfaces, an original sample preparation technique and a careful choice of analysis conditions enabled a chemical characterization of S distribution below metal/oxide interfaces. An initial heterogeneous distribution of S in as-received high S (3.2 ppmw) AM1 was measured. After oxidation, a S depletion profile formed, with a slope that depended on the initial bulk S content. GDMS measurements enabled a quantitative distribution of S in oxidized low S (0.14 ppmw) AM1 to be constructed and discussed in relation to equilibrium surface segregation of S on Ni. The quantity of S integrated in the thermally grown oxide (TGO) was estimated and found to be very similar to that measured from depletion found in the metal. Localized S enrichments in Pt-containing coatings are related to a possible beneficial trapping mechanism of Pt on the adherence of oxide scales.

Domaines

Matériaux
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Dates et versions

hal-03565646 , version 1 (11-02-2022)

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Thomas Gheno, Daniel Monceau, Djar Oquab, Yannick Cadoret. Characterization of sulfur distribution in Ni-based superalloy and thermal barrier coatings after high temperature oxidation: a SIMS analysis. Oxidation of Metals, 2009, 73 (1-2), pp.95-113. ⟨10.1007/s11085-009-9164-z⟩. ⟨hal-03565646⟩
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