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Article Dans Une Revue Quality and Reliability Engineering International Année : 2007

Optimum step-stress for temperature accelerated life testing

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hal-03436655 , version 1 (19-11-2021)

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Evans Gouno. Optimum step-stress for temperature accelerated life testing. Quality and Reliability Engineering International, 2007, 23 (8), pp.915-924. ⟨10.1002/qre.853⟩. ⟨hal-03436655⟩
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