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Communication Dans Un Congrès Année : 2021

Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements

Résumé

Using TLP (Transmission Line Pulse) and VF-TLP (Very Fast Transmission Line Pulse) to emulate a fast transient stress, a study of oxide reliability during a CDM (Charged Devise Model) event was done to establish an empirical law between the time to breakdown and the voltage applied to the gate. A wide array of transistors in different configurations was tested to reflect real situation during a CDM event.

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Domaines

Autre [cs.OH]
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Dates et versions

hal-03433046 , version 1 (17-11-2021)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

Citer

Chloé Troussier, Johan Bourgeat, Blaise Jacquier, Emmanuel Simeu, Jean-Daniel Arnould. Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements. IEEE International Reliability Physics Symposium (IRPS 2021), Mar 2021, Monterey, CA, United States. ⟨10.1109/IRPS46558.2021.9405110⟩. ⟨hal-03433046⟩
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