Article Dans Une Revue Microelectronics Reliability Année : 2021

Impact of radiation-induced soft error on embedded cryptography algorithms

Résumé

With the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved using embedded cryptography algorithms, which differ in performance, area, and reliability. This paper compares hardware implementations of the eXtended Tiny Encryption Algorithm (XTEA) and the Advanced Encryption Standard (AES) algorithms. Results show that the XTEA implementation gives the best relative performance (e.g., throughput, power), area, and soft error reliability trade-offs.

Dates et versions

hal-03375914 , version 1 (13-10-2021)

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Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, et al.. Impact of radiation-induced soft error on embedded cryptography algorithms. Microelectronics Reliability, 2021, ⟨10.1016/j.microrel.2021.114349⟩. ⟨hal-03375914⟩

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