XPS and ToF-SIMS Investigation of Native Oxides and Passive Films Formed on Nickel Alloys Containing Chromium and Molybdenum - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of The Electrochemical Society Année : 2021

XPS and ToF-SIMS Investigation of Native Oxides and Passive Films Formed on Nickel Alloys Containing Chromium and Molybdenum

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Matériaux

Dates et versions

hal-03361433 , version 1 (01-10-2021)

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Zuocheng Wang, Charly Carrière, Antoine Seyeux, Sandrine Zanna, Dimitri Mercier, et al.. XPS and ToF-SIMS Investigation of Native Oxides and Passive Films Formed on Nickel Alloys Containing Chromium and Molybdenum. Journal of The Electrochemical Society, 2021, 168 (4), pp.041503. ⟨10.1149/1945-7111/abf308⟩. ⟨hal-03361433⟩
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