Permanent Laser Fault Injection into the Flash Memory of a Microcontroller - Archive ouverte HAL
Communication Dans Un Congrès Année : 2021

Permanent Laser Fault Injection into the Flash Memory of a Microcontroller

Résumé

The Flash memory of a Microcontroller Unit (MCU) is an important part of its attack surface as it contains its firmware and its security related data (e.g. passwords and cryptographic keys). Recent research works report the use of Laser Fault Injections (LFI) to corrupt the firmware at run time by targeting the Flash memory during its read operations (data reads from Flash were also faulted). These faults, induced on a single bit and following a bit-set fault model, were nonpermanent: the data stored in Flash stayed unaltered while only their read copies were corrupted. We report an extension of this fault model on the Flash memory of a 32-bit MCU. Using LFI, we were able to induce permanent faults into its Flash. Single bit faults, that followed a bit-reset fault model, were induced during the Flash write operations. As a proof of concept, we describe how we were able to iteratively set to zero all the bits of a 32bit password using a laser pulse with relatively undemanding settings (15 µm beam diameter, and 3 µs pulse duration).
Fichier principal
Vignette du fichier
hal_NEWCAS_2021_Permanent_Laser_Fault_Injection_into_the_Flash_Memory_of_a_Microcontroller.pdf (964.11 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03360634 , version 1 (30-09-2021)

Identifiants

Citer

Raphael Viera, Jean-Max Dutertre, Mathieu Dumont, Pierre-Alain Moëllic. Permanent Laser Fault Injection into the Flash Memory of a Microcontroller. 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS), Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462773⟩. ⟨hal-03360634⟩
34 Consultations
280 Téléchargements

Altmetric

Partager

More