Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Microscopy Année : 2021

Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope

Renaud Podor
J. Lautru
D. Nogues
  • Fonction : Auteur
A. Candeias
  • Fonction : Auteur
A. Kolouch
  • Fonction : Auteur
M. Barreau
S. Mathieu
M. Vilasi

Résumé

A new high-temperature detector dedicated to the collection of backscattered electrons is used in combination with heating stages up to 1050°C, in high-vacuum and low-vacuum modes in order to evaluate its possibilities through signal-to-noise ration measurements and different applications. Four examples of material transformations occurring at high temperature are herein reported: grain growth during annealing of a rolled platinum foil, recrystallisation of a multiphased alloy, oxidation of a Ni-based alloy and complex phase transformations occurring during the annealing of an Al-Si coated boron steel. The detector could be potentially adapted to any type of SEM and it offers good opportunities to perform high-temperature experiments in various atmospheres.

Domaines

Chimie
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Dates et versions

hal-03336998 , version 1 (07-09-2021)

Identifiants

Citer

Renaud Podor, J. Mendonça, J. Lautru, H.P. Brau, D. Nogues, et al.. Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope. Journal of Microscopy, 2021, 282 (1), pp.45-59. ⟨10.1111/jmi.12979⟩. ⟨hal-03336998⟩
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