Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3: a high resolution electron microscopy study - Archive ouverte HAL
Article Dans Une Revue Materials Science and Engineering: A Année : 1993

Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3: a high resolution electron microscopy study

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Science des matériaux [cond-mat.mtrl-sci]

Jean-Luc PUTAUX  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-03258659

Soumis le : vendredi 11 juin 2021-16:40:41

Dernière modification le : mardi 3 septembre 2024-11:15:25

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hal-03258659 , version 1 (11-06-2021)

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Jany Thibault, Jean-Luc Putaux, Alain Jacques, Amand George, Henri-Marc Michaud, et al.. Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3: a high resolution electron microscopy study. Materials Science and Engineering: A, 1993, 164 (1-2), pp.93-100. ⟨10.1016/0921-5093(93)90646-V⟩. ⟨hal-03258659⟩

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