Journal Articles
International Journal of Critical Computer-Based Systems
Year : 2021
Yves Ledru : Connect in order to contact the contributor
https://hal.science/hal-03257052
Submitted on : Thursday, June 10, 2021-4:19:43 PM
Last modification on : Friday, March 24, 2023-2:53:22 PM
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Salim Chehida, Yves Ledru, Yoann Blein, German Eduardo Vega Baez. An SMT-Based Approach for Generating Trace Examples and Counter-examples of Parametric Properties. International Journal of Critical Computer-Based Systems, 2021, ⟨10.1504/IJCCBS.2021.117997⟩. ⟨hal-03257052⟩
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