Barkhausen noise analysis of thin film ferroelectrics - Archive ouverte HAL
Article Dans Une Revue Applied Physics Letters Année : 2020

Barkhausen noise analysis of thin film ferroelectrics

Résumé

The first direct Barkhausen noise measurement in a ferroelectric thin film is presented. The Barkhausen noise energy loop is reconstructed from the measured Barkhausen noise and is closely related to the classic ferroelectric P vs E hysteresis loop. Grain boundaries act as a dominant ferroelectric domain wall pinning site in a polycrystalline thin film based on the calculated domain wall jump distance using the Barkhausen noise frequency. The technique is promising for the measurement of ferroelectric switching dynamics, and provides a physical insight for improving application performance.
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Dates et versions

hal-03217442 , version 1 (04-05-2021)

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Keisuke Yazawa, Benjamin Ducharne, Hiroshi Uchida, Hiroshi Funakubo, John Blendell. Barkhausen noise analysis of thin film ferroelectrics. Applied Physics Letters, 2020, 117 (1), pp.012902. ⟨10.1063/5.0012635⟩. ⟨hal-03217442⟩
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