Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation
Résumé
This paper presents a discussion related to two different methods used to evaluate logic gate susceptibility considering Single Event Transient faults at the layout level. These methods can be adopted into radiation-hardening-driven optimizations to improve the overall reliability of circuits. The results show that the simulation approach presents a higher accuracy by considering charge-sharing effects. At the same time, the analytical method can provide similar results in a faster manner.
Domaines
Sciences de l'ingénieur [physics]| Origine | Fichiers produits par l'(les) auteur(s) |
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