The last years have seen the emergence of fault attacks targeting modern central processing units (CPUs). These attacks are analyzed at a very high abstraction level and, due to the modern CPUs complexity, the underlying fault effect is usually unknown. Recently, a few articles have focused on characterizing faults on modern CPUs. In this article, we focus on the electromagnetic fault injection (EMFI) characterization on a bare-metal implementation. With this approach, we discover and understand new effects on micro-architectural subsystems. We target the BCM2837 where we successfully demonstrate persistent faults on L1 instruction cache, L1 data cache and L2 cache. We also show that faults can corrupt the memory management unit (MMU). To validate our fault model, we realize a persistent fault analysis to retrieve an AES key.