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Communication Dans Un Congrès Année : 2020

Analysis of Parameter Variability in Integrated Devices by Partial Least Squares Regression

Résumé

This paper focuses on the application of the partial least squares (PLS) regression to the uncertainty quantification of the responses of complex stochastic systems. It considers the development of a surrogate model using a limited set of training samples in order to estimate statistical quantities of the system output with relatively low computational cost compared to the standard brute force Monte Carlo (MC) simulation. The performance and the strength of the proposed modeling scheme is investigated for an integrated voltage regulator (IVR) with 8 random variables. The results highlight the ability of the PLS regression to deals with complex nonlinear problems with very few principal components, also providing important insights about the input variables. © 2020 IEEE.

Dates et versions

hal-03103325 , version 1 (08-01-2021)

Identifiants

Citer

M. Larbi, R. Trinchero, F.G. Canavero, Philippe Besnier, M. Swaminathan. Analysis of Parameter Variability in Integrated Devices by Partial Least Squares Regression. 24th IEEE Workshop On Signal and Power Integrity, SPI 2020, May 2020, Cologne, Germany. pp.9218175, ⟨10.1109/SPI48784.2020.9218175⟩. ⟨hal-03103325⟩
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