Characterization by APT and TEM of Xe nano-bubbles in CeO 2

Only few experimental techniques are able to characterize the space and size distributions of gas-filled nano-cavities embedded in ceramic matrices. The aim of the current paper is to point out the potentiality of atom probe tomography for this objective. Nano-clusters enriched in Xe are evidenced in 3-D reconstructed volumes in Xe-implanted CeO2. Their size and density are comparable to bubble populations observed by TEM.

Mots clés

Defects implantation atom probe tomography transmission electron microscopy

Domaines

Matériaux

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NIMB_rev1_hal.pdf (609.5 Ko)

Origine	Fichiers produits par l'(les) auteur(s)

Dominique Mangelinck : Connectez-vous pour contacter le contributeur

https://hal.science/hal-03060510

Soumis le : lundi 14 décembre 2020-08:50:39

Dernière modification le : lundi 23 septembre 2024-09:22:24

Archivage à long terme le : lundi 15 mars 2021-18:40:59

Dates et versions

hal-03060510 , version 1 (14-12-2020)

Identifiants

HAL Id : hal-03060510 , version 1
DOI : 10.1016/j.nimb.2020.02.032

Citer

Carine Perrin-Pellegrino, Myriam Dumont, Mohamed Fadel Keïta, Thomas Neisius, Georges Mikaelian, et al.. Characterization by APT and TEM of Xe nano-bubbles in CeO 2. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2020, 469, pp.24-27. ⟨10.1016/j.nimb.2020.02.032⟩. ⟨hal-03060510⟩

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