Editorial - Special Issue: Current Trends in Optical and X–Ray Metrology of Advanced Materials for Nanoscale Devices & Epitaxial Integration of Dissimilar Materials. - Archive ouverte HAL
Article Dans Une Revue Physica Status Solidi A (applications and materials science) Année : 2019

Editorial - Special Issue: Current Trends in Optical and X–Ray Metrology of Advanced Materials for Nanoscale Devices & Epitaxial Integration of Dissimilar Materials.

Mircea Modreanu
  • Fonction : Auteur
Hiroyuki Fujiwara
  • Fonction : Auteur
Gerald Jellison
  • Fonction : Auteur
Gavin Bell
  • Fonction : Auteur
Clement Merckling
  • Fonction : Auteur

Dates et versions

hal-03034470 , version 1 (01-12-2020)

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Citer

Mircea Modreanu, Charles Cornet, Olivier Durand, Hiroyuki Fujiwara, Gerald Jellison, et al.. Editorial - Special Issue: Current Trends in Optical and X–Ray Metrology of Advanced Materials for Nanoscale Devices & Epitaxial Integration of Dissimilar Materials.. Physica Status Solidi A (applications and materials science), 2019, 216 (8), pp.1900251. ⟨10.1002/pssa.201900251⟩. ⟨hal-03034470⟩
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