Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure

Résumé

A new optical-based pixel-wise full-field strain measurement method is proposed. This method allows for high spatial resolution quantification of strain heterogeneities. It is based on the production of a fine speckle pattern, the use of a large sensor camera with high magnification lens and a pixel-wise optical flow algorithm. The measured strain localizations are analyzed with regards to the microstructure of a ferritic-pearlitic steel.
Fichier principal
Vignette du fichier
20-02-28_PM-iDICs_abstract.pdf (1.14 Mo) Télécharger le fichier
Origine Fichiers éditeurs autorisés sur une archive ouverte

Dates et versions

hal-03030937 , version 1 (14-12-2020)

Licence

Identifiants

  • HAL Id : hal-03030937 , version 1

Citer

Adrien Berger, Jean-François Witz, Ahmed El Bartali, N Limodin, Mirentxu Dubar, et al.. Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure. Photomechanics IDICS Conference, Oct 2020, Nantes, France. ⟨hal-03030937⟩
121 Consultations
91 Téléchargements

Partager

More