FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue European Physical Journal: Applied Physics Année : 2004

FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps

Résumé

The kinetics of "metal-acceptor" pairing in boron-doped multicrystalline samples is investigated by means of contactless lifetime measurement. The case of FeB and CrB pairs is discussed and the influence of extended defect is evidenced for FeB. It is found that the reassociation of the "metal-acceptor" pairs is fast immediately after the dissociation and then slows down for several days. The results allow the identification of mixed contamination by Cr and Fe.
Fichier principal
Vignette du fichier
apd109.pdf (617.23 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03019082 , version 1 (23-11-2020)

Identifiants

  • HAL Id : hal-03019082 , version 1

Citer

O Palais, P Hidalgo, S Martinuzzi. FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps. European Physical Journal: Applied Physics, 2004. ⟨hal-03019082⟩
32 Consultations
55 Téléchargements

Partager

Gmail Mastodon Facebook X LinkedIn More