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Article Dans Une Revue Journal of Applied Physics Année : 2013

Sensitization of Pr 3+ ions by Eu 2+ ions in CaF 2 thin films deposited by evaporation

Résumé

In the present article, we analyse the possibility of sensitizing the 3Pj levels of Pr3+ ion with Eu2+ ion in CaF2 thin film deposited by evaporation. Indeed, the forbidden nature of the 4f-4f transition of Pr3+ ion makes its absorption too weak for thin film applications, while materials doped with the Pr3+-Yb3+ couple are promising candidates for the achievement of efficient down-converter systems and could allow strong reduction of thermalization losses in silicon solar cells.
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Dates et versions

hal-03013662 , version 1 (19-11-2020)

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A Guille, A Pereira, Amina Bensalah, B Moine, M. Novotny, et al.. Sensitization of Pr 3+ ions by Eu 2+ ions in CaF 2 thin films deposited by evaporation. Journal of Applied Physics, 2013, 114 (20), pp.203509. ⟨10.1063/1.4836856⟩. ⟨hal-03013662⟩
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