Noise evasion properties of electrostatic gap-closing MEMS resonators with pulsed excitation waveforms - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

Noise evasion properties of electrostatic gap-closing MEMS resonators with pulsed excitation waveforms

Résumé

The limits on MEMS resonant sensor performance set by nonlinearity are often studied through a model of a Duffing resonator, with linear actuation. This model largely fails to capture the properties of MEMS resonant sensors with electrostatic gap-closing actuation. We have shown that a specific feature of such ubiquitous resonators is that their stability is strongly sensitive to the waveform used to drive them to resonance. In this paper, we conduct an analytical investigation of these phenomena and validate our theoretical results transient simulations.
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Dates et versions

hal-02962433 , version 1 (09-10-2020)

Identifiants

  • HAL Id : hal-02962433 , version 1

Citer

Jérôme Juillard, Antonio Somma, Alexis Brenes. Noise evasion properties of electrostatic gap-closing MEMS resonators with pulsed excitation waveforms. Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics (IFCS-ISAF 2020), Jul 2020, Online, United States. Paper ID 4424. ⟨hal-02962433⟩
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