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Article Dans Une Revue Physical Review B Année : 2000

Tunneling magnetoresistance and induced domain structure in Al 2 O 3 -based junctions

Résumé

Magnetization reversal in sputtered Co and oxidized Co ͑CoOx͒ layers are studied using transport measurements and magneto-optic Kerr effect. When associated in a magnetic tunnel junction, the two magnetic layers show a strong ferromagnetic coupling. Using the tunnel magnetoresistive effect as a probe for micromagnetic studies, we show the existence of an unexpected domain structure in the soft Co layer. This domain structure originates from the duplication of the domain structure of the hard CoOx magnetic layer template into the soft Co layer via the ferromagnetic coupling.
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Dates et versions

hal-02954378 , version 1 (01-10-2020)

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M Hehn, O Lenoble, D Lacour, C Féry, M Piécuch, et al.. Tunneling magnetoresistance and induced domain structure in Al 2 O 3 -based junctions. Physical Review B, 2000, 61 (17), pp.11643. ⟨10.1103/PhysRevB.61.11643⟩. ⟨hal-02954378⟩
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