Real Time Observation of the Directional Solidification of Multicrystalline Silicon: X-ray Imaging Characterization - Archive ouverte HAL
Article Dans Une Revue Energy Procedia Année : 2012

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hal-02895220 , version 1 (09-07-2020)

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A. Tandjaoui, N. Mangelinck-Noel, G. Reinhart, J-J. Furter, B. Billia, et al.. Real Time Observation of the Directional Solidification of Multicrystalline Silicon: X-ray Imaging Characterization. Energy Procedia, 2012, 27, pp.82-87. ⟨10.1016/j.egypro.2012.07.033⟩. ⟨hal-02895220⟩
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