Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging - Archive ouverte HAL
Article Dans Une Revue Journal of Crystal Growth Année : 2013

Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging

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https://hal.science/hal-02895204

Soumis le : jeudi 9 juillet 2020-15:18:16

Dernière modification le : lundi 10 juin 2024-16:58:03

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hal-02895204 , version 1 (09-07-2020)

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Amina Tandjaoui, Nathalie Mangelinck-Noël, Guillaume Reinhart, Bernard Billia, Tamzin Lafford, et al.. Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging. Journal of Crystal Growth, 2013, 377, pp.203 - 211. ⟨10.1016/j.jcrysgro.2013.05.023⟩. ⟨hal-02895204⟩

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